MEMS Technology News & Events

Norcada to exhibit at M&M 2013

June 18, 2013

Norcada will exhibit at MAS 2013 annual Microscopy and Microanalysis conference in Indianapolis, Indiana during August 4-8, 2013.  We welcome all participants of the conference to visit Norcada booth #1512 and discover the wide array of scientific MEMS products we offer that include silicon nitride TEM grids, silicon nitride Xray windows, and single crystal silicon membranes. The show will also provide an excellent

Norcada researcher featured by AITF

June 8, 2013

Norcada and one of its researchers Hooman Hosseinkhannazer have been featured in a success story by Alberta Innovates Technology Future (AITF) for the company’s success in developing and commercializing thin film MEMS devices for electron and X-ray microscopy research applications. The story outlined the market opportunity identified by the company in 2005 and its subsequent

Norcada to exhibit at M&M 2012

June 8, 2012

Norcada will exhibit at MAS 2012 annual Microscopy and Microanalysis conference in Phoenix, AZ.  This year, the M&M conference will be held from July 29 to August 2, 2012.  Norcada booth number is 845.  We welcome all participants of the conference to visit our booth and discover the wide array of scientific MEMS products we offer that include silicon nitride TEM grids, silicon nitride Xray

Microporous silicon nitride TEM windows

April 23, 2012

Norcada announced today the launch of their two newest microporous Silicon Nitride TEM windows to the microscopy and microanalysis communities.These Transmission Electron Microscope (TEM) sample holders have a mesh structure with 2µm diameter holes and 3µm distance, and their uniform high quality silicon nitride film is available in 50nm and 200nm thicknesses. These devices perform

Norcada launches microporous SiNx membranes for microscopy

January 11, 2012

Norcada announced today the launch of their two newest microporous Silicon Nitride TEM windows to the microscopy and microanalysis communities. These Transmission Electron Microscope (TEM) sample holders have a mesh structure with 2µm diameter holes and 3µm distance, and their uniform high quality silicon nitride film is available in 50nm and 200nm thicknesses. These devices

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